The 800 micron thick ion-implant solid state devices are covered with a 450 µg/cm2 (Si eq) absorbing window which eliminates ions up to 350 keV through the mass dependent range-energy relationship.
The 9 individual strips on the three focal plane detectors are interrogated
by a multichannel switched-charge/voltage-converter (SCVC) in monolythic
technology. The SCVC provides for each particle coded information on the
strip number and particle energy. This primary information is transferred
to the DPU for further evaluation.
|© 2009, Max Planck Institute for
Solar System Research, Lindau
|P. W. Daly