Each scan consisted of 101 raster steps of approx. 1.13 arsec with an exposure time of 8 seconds each, leading to approx. 14 minutes per scan. The scans were taken in four emission lines simultaneously, namely
Neon VIII 770.41 Å Corona 600 000 K Neon VIII 780.32 Å Carbon IV 1548.20 Å Transition Region 100 000 K Carbon IV 1550.77 Åfor the first and second scan, and
Silicon IV 1393.76 Å Transition Region 140 000 K Silicon IV 1402.77 Å Oxygen IV 1401.16 Å Transition Region 170 000 K Oxygen IV 1404.81 Å (blend with Sulfur IV)for the third and fourth scan.
An on-board compression scheme ("Method 11") was used for this study, resulting in the transmission of just two values per spatial pixel: (a) the total intensity, and (b) and estimated line position within the spectral window, which is calculated by fitting the profile to a Gaussian and taking the centroid. The spectral window is approx. 1.05 Å in second order (Ne VIII) and 2.1 Å in first order (C IV, Si IV, O IV) around the commanded wavelength.
The intensities in the pictures below are not on the same scale, whereas the Doppler pictures all show velocities between +/- 50 km/s on the same scale. A mixture of dark red and blue pixels here is usually an indication for noise due to low intensity, which is clearly to be observed e.g. in the filament's absorption of the Ne VIII line. - The last O IV Doppler picture shows mainly noise, due to the line blend with S IV (a situation that Method 11 is not suited for); the significant redshift in the region of the filament is probably due to a stronger influence of the (colder) O III line at 702.8 Å (second order), pushing the spectral window's center of gravity to a longer wavelength.
IED, 08.May.97